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Please use this identifier to cite or link to this item: http://dspace.bits-pilani.ac.in:8080/jspui/xmlui/handle/123456789/9771
Title: Role of machine learning and deep learning in securing 5G-driven industrial IoT applications
Authors: Chamola, Vinay
Gupta, Shashank
Keywords: EEE
Computer Science
Industrial Internet of Things (IIoT)
Security
Machine Learning
Deep Learning
Artificial intelligence (AI)
Blockchain
Issue Date: Dec-2021
Publisher: Elsevier
Abstract: The Internet of Things (IoT) connects millions of computing devices and has set a stage for future technology where industrial use cases like smart cities and smart houses will operate with minimal human intervention. IoT’s cross-domain amalgamations with emergent technologies like 5G and blockchain affects human life. Hence, increase in reliance over IoT necessitates focus on its privacy and security concerns. Implementing security through encryption, authentication, access control and communication security is the need of the hour. These needs can be best catered with the use of machine learning (ML) and deep learning (DL) that can help in realizing secure intelligent systems. In this work, the authors present a comprehensive review for securing Industrial-IoT (I-IoT) devices to contribute to the development of security methods for I-IoT deployed over 5G and blockchain. The survey provides a general analysis of the state-of-the-art security implementation and further assesses the product life cycle of IoT devices. The authors present numerous virtues as well as faults in the machine learning and deep learning algorithms deployed over the fog architecture in context with the security solutions. The potential security algorithms can help overcome many challenges in the IoT security and pave way for implementation with emerging technologies like 5G, blockchain, edge computing, fog computing and their use cases for creating smart environments.
URI: https://www.sciencedirect.com/science/article/pii/S1570870521001906
http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/9771
Appears in Collections:Department of Electrical and Electronics Engineering

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