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Results 11-19 of 19 (Search time: 0.002 seconds).
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Issue Date
Title
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2001
Reliability issues of ultra thin silicon nitride (a-SiN:H) by hot wire CVD for deep sub-micron CMOS technologies
Rao, V. Ramgopal
2001-07
Multi-Frequency Transconductance Technique for Interface Characterization of Deep Sub-Micron SOI-MOSFETs
Rao, V. Ramgopal
2001
High Field Stressing Effects in JVD Nitride Capacitors
Rao, V. Ramgopal
2001-04
Performance and Hot-Carrier Reliability of 100 nm Channel Length Jet Vapor Deposited Si3N4 MNSFETs
Rao, V. Ramgopal
2001-10
A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping technique
Rao, V. Ramgopal
2001-07
Analysis of Floating Body Effects in Thin Film Conventional and Single Pocket SOI MOSFETs using the GIDL Current Technique
Rao, V. Ramgopal
2001-07
Analysis of floating body effects in thin film SOI MOSFETs using the GIDL current technique
Rao, V. Ramgopal
2001-07
Sub-100 nm CMOS circuit performance with high-K gate dielectrics
Rao, V. Ramgopal
2001-10
Characterization of lateral asymmetric channel (LAC) thin film SOI MOSFETs
Rao, V. Ramgopal
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EEE
8
MOSFETs
3
Charge pumping
3
Current measurement
3
Los Angeles Council
3
SOI–MOSFETs
3
Tunneling
2
CMOS technology
2
Degradation
2
High-K gate dielectrics
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