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Issue Date
Title
Author(s)
2007
Parasitic Effects Depending on Shape of Spacer Region on FinFETs
Rao, V. Ramgopal
2003-01
Small signal characteristics of thin film single halo SOI MOSFET for mixed mode applications
Rao, V. Ramgopal
2003
Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applications
Rao, V. Ramgopal
2003-01
Detailed analysis of FIBL in MOS transistors with high-k gate dielectrics
Rao, V. Ramgopal
2003
Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs
Rao, V. Ramgopal
2003-01
Application of look-up table approach to high-K gate dielectric MOS transistor circuits
Rao, V. Ramgopal
2003-09
The Impact of Channel Engineering on the Performance Reliability and Scaling of CHISEL NOR Flash EEPROMs
Rao, V. Ramgopal
2001
Suppression of Parasitic BJT Action in Single Pocket Thin Film Deep Sub-Micron SOI MOSFETs
Rao, V. Ramgopal
2001
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2001-09
The Impact of High-K Gate Dielectrics on Sub 100 nm CMOS Circuit Performance
Rao, V. Ramgopal
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EEE
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MOSFETs
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Degradation
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MOSFET circuits
7
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7
CMOS technology
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FinFETs
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Threshold voltage
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