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Issue Date | Title | Author(s) |
---|---|---|
2003-08 | Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing | Rao, V. Ramgopal |
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- 1 Dielectrics
- 1 EEE
- 1 Stress
- 1 Voltage
Date issued
- 1 2003