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Issue Date
Title
Author(s)
1998-05
Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devices
Rao, V. Ramgopal
1998-12
Flicker Noise in GaN/Al Ga N Doped Channel Heterostructure Field Effect Transistors
Rao, V. Ramgopal
1998-11
Application of charge pumping technique for sub-micron MOSFET characterization
Rao, V. Ramgopal
1998-05
Electric field tailoring in MBE-grown vertical sub-100 nm MOSFETs
Rao, V. Ramgopal
1998-10
Sub-0.18 /spl mu/m SOI MOSFETs using lateral asymmetric channel profile and Ge pre-amorphization salicide technology
Rao, V. Ramgopal
1998
Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs
Rao, V. Ramgopal
1998-09
A Study of the Effect of Plasma Etch Damage on Sub-Micron MOSFET's Flicker Noise Properties
Rao, V. Ramgopal
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Subject
1
Degradation
1
Electric fields
1
Electron traps
1
Electronic devices
1
FET’s
1
Gallium compounds
1
Los Angeles Council
1
Nitrogen compounds
1
Plasma measurements
1
Plasma simulation
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