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Results 1-10 of 19 (Search time: 0.002 seconds).
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Issue Date
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2001-09
Low temperature silicon nitride deposited by Cat-CVD for deep sub-micron metal–oxide–semiconductor devices
Rao, V. Ramgopal
2001-11
A simple and direct technique for interface characterization of SOI MOSFETs and its application in hot carrier degradation studies in sub-100 nm JVD MNSFETs
Rao, V. Ramgopal
2001-07
Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI–MOSFETs
Rao, V. Ramgopal
2001
Comparison of Sub-Bandgap Impact Ionization in Sub-100 nm Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2001
Suppression of Parasitic BJT Action in Single Pocket Thin Film Deep Sub-Micron SOI MOSFETs
Rao, V. Ramgopal
2001
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2001-09
The Impact of High-K Gate Dielectrics on Sub 100 nm CMOS Circuit Performance
Rao, V. Ramgopal
2001
Effect of Fringing Capacitances in Sub 100 nm MOSFET's with High-K Gate Dielectrics
Rao, V. Ramgopal
2001
Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
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EEE
8
MOSFETs
3
Charge pumping
3
Current measurement
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Los Angeles Council
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Tunneling
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CMOS technology
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Degradation
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High-K gate dielectrics
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