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Results 121-130 of 130 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
2004-07
Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS Memories
Rao, V. Ramgopal
2004-07
Understanding the NBTI Degradation in Halo- Doped Channel p-MOSFETs
Rao, V. Ramgopal
2003-04
Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologies
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
2002-04
Simulation Study of Non-Quasi Static Behaviour of MOS Transistors
Rao, V. Ramgopal
2001-10
Characterization of lateral asymmetric channel (LAC) thin film SOI MOSFETs
Rao, V. Ramgopal
2002-09
Optimization of Single Halo p-MOSFET Implant Parameters for Improved Analog Performance and Reliability
Rao, V. Ramgopal
2002
Suppression of boron penetration by hot wire CVD polysilicon
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
2000
Low temperature Hot-Wire CVD nitrides for deep sub-micron CMOS technologies
Rao, V. Ramgopal
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128
EEE
37
MOSFETs
9
Degradation
9
MOSFET circuits
7
Capacitance
7
CMOS technology
7
FinFETs
7
Threshold voltage
6
Circuit simulation
6
Hot carriers
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