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Issue Date
Title
Author(s)
1999-07
The impact of high-/spl kappa/ gate dielectrics and metal gate electrodes on sub-100 nm MOSFETs
Rao, V. Ramgopal
1999
Gate Stack Architecture Analysis and Channel Engineering in Deep Sub-Micron MOSFETs
Rao, V. Ramgopal
1999-10
Exploration of Velocity Overshoot in a High-Performance Deep Sub-0.1- m SOI MOSFET with Asymmetric Channel Profile
Rao, V. Ramgopal
1997-12
Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs
Rao, V. Ramgopal
1992-01
Radiation Induced Interface State Generation in Nitrided and Reoxidized Nitrided Gate Oxides
Rao, V. Ramgopal
1997-10
The Planar-Doped-Barrier FET:MOSFET Overcomes Conventional Limitations
Rao, V. Ramgopal
1998-05
Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devices
Rao, V. Ramgopal
1998-12
Flicker Noise in GaN/Al Ga N Doped Channel Heterostructure Field Effect Transistors
Rao, V. Ramgopal
1997-03
Charge trapping behaviour in deposited and grown thin metal-oxide-semiconductor gate dielectrics
Rao, V. Ramgopal
1999-05
A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs
Rao, V. Ramgopal
Discover
Subject
11
MOSFETs
4
Degradation
2
Annealing
2
Electron traps
2
Etching
2
Hot carriers
2
Los Angeles Council
2
Metal-oxide-semiconductor (MOS)
2
MOS devices
2
Noise figure
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