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Issue Date
Title
Author(s)
2001-09
The Impact of High-K Gate Dielectrics on Sub 100 nm CMOS Circuit Performance
Rao, V. Ramgopal
2001
Effect of Fringing Capacitances in Sub 100 nm MOSFET's with High-K Gate Dielectrics
Rao, V. Ramgopal
2001
Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering
Rao, V. Ramgopal
2000-09
Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
2001
Reliability issues of ultra thin silicon nitride (a-SiN:H) by hot wire CVD for deep sub-micron CMOS technologies
Rao, V. Ramgopal
2001-07
Multi-Frequency Transconductance Technique for Interface Characterization of Deep Sub-Micron SOI-MOSFETs
Rao, V. Ramgopal
2001
High Field Stressing Effects in JVD Nitride Capacitors
Rao, V. Ramgopal
2021-02
Nondestructive Evaluation of Mechanical Properties of Femur Bone
Rao, V. Ramgopal
1997-12
Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs
Rao, V. Ramgopal
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366
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Degradation
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FinFET
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