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Results 11-16 of 16 (Search time: 0.002 seconds).
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Issue Date
Title
Author(s)
2003-01
Detailed analysis of FIBL in MOS transistors with high-k gate dielectrics
Rao, V. Ramgopal
2003
Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs
Rao, V. Ramgopal
2003-01
Application of look-up table approach to high-K gate dielectric MOS transistor circuits
Rao, V. Ramgopal
2003-09
The Impact of Channel Engineering on the Performance Reliability and Scaling of CHISEL NOR Flash EEPROMs
Rao, V. Ramgopal
2003-02
A novel dynamic threshold operation using electrically induced junction MOSFET in the deep sub-micrometer CMOS regime
Rao, V. Ramgopal
2003-04
Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologies
Rao, V. Ramgopal
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6
MOSFETs
2
Capacitance
2
CMOS technologies
2
Degradation
2
EPROM
2
Medical simulation
2
Monte Carlo methods
2
MOSFET circuits
2
Threshold voltage
2
Transistors
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