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Issue Date | Title | Author(s) |
---|---|---|
2000-09 | Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime | Rao, V. Ramgopal |
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- 1 EEE
- 1 Low voltage
- 1 MOSFETs
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- 1 Temperature