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Issue Date
Title
Author(s)
2009
Highly robust nanoscale planar double-gate MOSFET device and SRAM cell immune to gate-misalignment and process variations
Rao, V. Ramgopal
2009
Benchmarking the device performance at sub 22 nm node technologies using an SoC framework
Rao, V. Ramgopal
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Random access memory
1
Doping profiles
1
Electrostatic discharges
1
Integrated circuit interconnections
1
Inverters
1
MOSFET circuits
1
MOSFETs
1
Nanoelectronics
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Robustness
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Date issued
2
2009
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false