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Issue Date
Title
Author(s)
2009-12
Filament study of STI type drain extended NMOS device using transient interferometric mapping
Rao, V. Ramgopal
2010-05
On the failure mechanism and current instabilities in RESURF type DeNMOS device under ESD conditions
Rao, V. Ramgopal
2010-05
On the differences between 3D filamentation and failure of N & P type drain extended MOS devices under ESD condition
Rao, V. Ramgopal
2010-01
Fabrication and characterization of novel polymer composite microcantilever sensors for explosive detection
Rao, V. Ramgopal
2011-02
High Yield Polymer MEMS Process for CMOS/MEMS Integration
Rao, V. Ramgopal
2007
Patterned Microfluidic Channels Using Self-assembled Hydroxy-Phenyl Porphyrin Monolayer
Rao, V. Ramgopal
2008
Sub-20 nm gate length FinFET design: Can high-κ spacers make a difference?
Rao, V. Ramgopal
2008-06
Closed Form Current and Conductance Model for Symmetric Double-Gate MOSFETs using Field-dependent Mobility and Body Doping
Rao, V. Ramgopal
2007
A Simple and Direct Method for Interface Characterization of OFETs
Rao, V. Ramgopal
2007
Drain current model for undoped symmetric double-gate FETs using a velocity saturation model with exponent n=2
Rao, V. Ramgopal
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366
EEE
50
MOSFETs
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Microcantilevers
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Organic field effect transistors ...
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Sensors
13
Degradation
12
CMOS technologies
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FinFET
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CMOS technology
10
MOSFET circuits
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35
2020 - 2023
181
2010 - 2019
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2000 - 2009
25
1992 - 1999
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