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Issue Date
Title
Author(s)
2001-04
Performance and Hot-Carrier Reliability of 100 nm Channel Length Jet Vapor Deposited Si3N4 MNSFETs
Rao, V. Ramgopal
2001-10
A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping technique
Rao, V. Ramgopal
2002-05
The effect of high-K gate dielectrics on deep submicrometer CMOS device and circuit performance
Rao, V. Ramgopal
2002-07
Ultra-thin silicon nitride by hot wire chemical vapor deposition (HWCVD) for deep sub-micron CMOS technologies
Rao, V. Ramgopal
2001-07
Analysis of Floating Body Effects in Thin Film Conventional and Single Pocket SOI MOSFETs using the GIDL Current Technique
Rao, V. Ramgopal
2001-07
Analysis of floating body effects in thin film SOI MOSFETs using the GIDL current technique
Rao, V. Ramgopal
2002-06
Optimization and realization of sub-100-nm channel length single halo p-MOSFETs
Rao, V. Ramgopal
2002
Status and Trends in Molecular Electronics
Rao, V. Ramgopal
2001-07
Sub-100 nm CMOS circuit performance with high-K gate dielectrics
Rao, V. Ramgopal
2022-01
Energy Efficient Lif Neuron Circuit Using Hybrid Cmos-Nems in 65 Nm Cmos Technology
Rao, V. Ramgopal
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Subject
39
MOSFETs
18
Microcantilevers
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Organic field effect transistors ...
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Sensors
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CMOS technologies
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FinFET
10
MEMS
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Self-assembled monolayer (SAM)
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CMOS technology
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Degradation
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Date issued
35
2020 - 2024
181
2010 - 2019
128
2000 - 2009
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