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Results 11-20 of 25 (Search time: 0.02 seconds).
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Issue Date
Title
Author(s)
1999-09
Low temperature-high pressure grown thin gate dielectrics for MOS applications
Rao, V. Ramgopal
1997-03
High-field stressing of LPCVD gate oxides
Rao, V. Ramgopal
1999-09
A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping
Rao, V. Ramgopal
1998-11
Application of charge pumping technique for sub-micron MOSFET characterization
Rao, V. Ramgopal
1998-05
Electric field tailoring in MBE-grown vertical sub-100 nm MOSFETs
Rao, V. Ramgopal
1996-06
Hysteresis behavior in 85-nm channel length vertical n-MOSFETs grown by MBE
Rao, V. Ramgopal
1996-09
Neutral electron trap generation under irradiation in reoxidized nitrided gate dielectrics
Rao, V. Ramgopal
1992-01
Radiation‐induced interface‐state generation in reoxidized nitrided SiO2
Rao, V. Ramgopal
1998-10
Sub-0.18 /spl mu/m SOI MOSFETs using lateral asymmetric channel profile and Ge pre-amorphization salicide technology
Rao, V. Ramgopal
1999
Hot-Carrier Induced Interface Degradation in Jet Vapor Deposited SiN MNSFETs as Studied by a Novel Charge Pumping Technique
Rao, V. Ramgopal
Discover
Subject
11
MOSFETs
4
Degradation
2
Annealing
2
Electron traps
2
Etching
2
Hot carriers
2
Los Angeles Council
2
Metal-oxide-semiconductor (MOS)
2
MOS devices
2
Noise figure
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Date issued
10
1999
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1998
4
1997
2
1992
2
1996