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Results 1-10 of 16 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
2003-04
Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologies
Rao, V. Ramgopal
2003
Device and circuit performance issues with deeply scaled high-K MOS transistors
Rao, V. Ramgopal
2003-04
Highly conducting doped poly-Si deposited by hot wire CVD and its applicability as gate material for CMOS devices
Rao, V. Ramgopal
2003-10
CHISEL programming operation of scaled NOR flash EEPROMs-effect of voltage scaling, device scaling and technological parameters
Rao, V. Ramgopal
2003-12
Impact of lateral asymmetric channel doping on deep submicrometer mixed-signal device and circuit performance
Rao, V. Ramgopal
2003-04
Modeling of parasitic capacitances in deep submicrometer conventional and high-K dielectric MOS transistors
Rao, V. Ramgopal
2003-04
A new method to characterize border traps in submicron transistors using hysteresis in the drain current
Rao, V. Ramgopal
2003-08
Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing
Rao, V. Ramgopal
2003-01
Small signal characteristics of thin film single halo SOI MOSFET for mixed mode applications
Rao, V. Ramgopal
2003
Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applications
Rao, V. Ramgopal
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EEE
6
MOSFETs
2
Capacitance
2
CMOS technologies
2
Degradation
2
EPROM
2
Medical simulation
2
Monte Carlo methods
2
MOSFET circuits
2
Threshold voltage
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