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Issue Date
Title
Author(s)
2001
Suppression of Parasitic BJT Action in Single Pocket Thin Film Deep Sub-Micron SOI MOSFETs
Rao, V. Ramgopal
2001
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2001
Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
2001-04
Performance and Hot-Carrier Reliability of 100 nm Channel Length Jet Vapor Deposited Si3N4 MNSFETs
Rao, V. Ramgopal
2001-10
A study of hot-carrier induced interface-trap profiles in lateral asymmetric channel MOSFETs using a novel charge pumping technique
Rao, V. Ramgopal
2001-07
Analysis of Floating Body Effects in Thin Film Conventional and Single Pocket SOI MOSFETs using the GIDL Current Technique
Rao, V. Ramgopal
2001-07
Analysis of floating body effects in thin film SOI MOSFETs using the GIDL current technique
Rao, V. Ramgopal
Discover
Author
8
Rao, V. Ramgopal
Subject
8
EEE
3
Charge pumping
3
Current measurement
2
Hot carriers
2
Leakage current
2
Los Angeles Council
2
Transistors
2
Tunneling
1
CMOS technology
1
Degradation
.
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