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Results 11-20 of 37 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
2003
Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applications
Rao, V. Ramgopal
2003-01
Detailed analysis of FIBL in MOS transistors with high-k gate dielectrics
Rao, V. Ramgopal
2003-01
Application of look-up table approach to high-K gate dielectric MOS transistor circuits
Rao, V. Ramgopal
2001
Suppression of Parasitic BJT Action in Single Pocket Thin Film Deep Sub-Micron SOI MOSFETs
Rao, V. Ramgopal
2001
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2001
Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering
Rao, V. Ramgopal
2000-09
Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
2009-09
Drain current model for nanoscale double-gate MOSFETs
Rao, V. Ramgopal
2005-07
Semiconductor Science and Technology Design of a 0.1 µm single halo (SH) thin film silicon-on-insulator (SOI) MOSFET for analogue applications
Rao, V. Ramgopal
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Rao, V. Ramgopal
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EEE
5
Hot carriers
5
Los Angeles Council
3
Charge pumping
3
Circuit simulation
3
Current measurement
3
Degradation
3
FinFETs
3
Medical simulation
3
Semiconductor device doping
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