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Results 21-30 of 30 (Search time: 0.002 seconds).
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Issue Date
Title
Author(s)
1996-06
Hysteresis behavior in 85-nm channel length vertical n-MOSFETs grown by MBE
Rao, V. Ramgopal
1996-09
Neutral electron trap generation under irradiation in reoxidized nitrided gate dielectrics
Rao, V. Ramgopal
1992-01
Radiation‐induced interface‐state generation in reoxidized nitrided SiO2
Rao, V. Ramgopal
1998-10
Sub-0.18 /spl mu/m SOI MOSFETs using lateral asymmetric channel profile and Ge pre-amorphization salicide technology
Rao, V. Ramgopal
1999
Hot-Carrier Induced Interface Degradation in Jet Vapor Deposited SiN MNSFETs as Studied by a Novel Charge Pumping Technique
Rao, V. Ramgopal
1999
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric
Rao, V. Ramgopal
1999-09
Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics
Rao, V. Ramgopal
1999
Channel engineering for high speed sub-1.0 V power supply deep sub-micron CMOS
Rao, V. Ramgopal
1998
Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs
Rao, V. Ramgopal
1998-09
A Study of the Effect of Plasma Etch Damage on Sub-Micron MOSFET's Flicker Noise Properties
Rao, V. Ramgopal
Discover
Author
25
Rao, V. Ramgopal
4
Chaubey, V.K.
1
Bhanot, Surekha
Subject
11
MOSFETs
4
Degradation
2
Annealing
2
Electron traps
2
Etching
2
Hot carriers
2
Los Angeles Council
2
Metal-oxide-semiconductor (MOS)
2
MOS devices
2
Noise figure
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Date issued
29
1990 - 1999
1
1988 - 1989