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Issue Date
Title
Author(s)
1999-07
The impact of high-/spl kappa/ gate dielectrics and metal gate electrodes on sub-100 nm MOSFETs
Rao, V. Ramgopal
1999-05
A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs
Rao, V. Ramgopal
1999-09
A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping
Rao, V. Ramgopal
1999
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric
Rao, V. Ramgopal
1999-09
Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics
Rao, V. Ramgopal
1999
Channel engineering for high speed sub-1.0 V power supply deep sub-micron CMOS
Rao, V. Ramgopal
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Author
6
Rao, V. Ramgopal
Subject
2
Degradation
2
MOS devices
1
Capacitance
1
Charge pumping
1
Charge pumping (CP)
1
DH-HEMTs
1
Dielectrics and electrical insula...
1
Gate leakage
1
High-K gate dielectrics
1
Hot carriers
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