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Issue Date
Title
Author(s)
1997-03
High-field stressing of LPCVD gate oxides
Rao, V. Ramgopal
1999
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric
Rao, V. Ramgopal
1999-09
Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics
Rao, V. Ramgopal
1998
Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs
Rao, V. Ramgopal
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Rao, V. Ramgopal
Subject
1
Thermal stresses
1
Transconductance
1
Voltage
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1999
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1997
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1998
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