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Issue Date
Title
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2009
Benchmarking the device performance at sub 22 nm node technologies using an SoC framework
Rao, V. Ramgopal
2008
Sub-20 nm gate length FinFET design: Can high-κ spacers make a difference?
Rao, V. Ramgopal
2009
The Electrochemical Society, find out more Analysis of Threshold Voltage Variations of FinFETs Relating to Short Channel Effects
Rao, V. Ramgopal
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Subject
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Circuits
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Design methodology
1
Electrostatic discharges
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Integrated circuit interconnections
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Inverters
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Nanoscale devices
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Nanotechnology
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Random access memory
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Robust stability
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Semiconductor process modeling
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Date issued
2
2009
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2008