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Issue Date
Title
Author(s)
2004
The influence of process variations on the Halo MOSFETs and its implications on the analog circuit performance
Rao, V. Ramgopal
2003-02
A novel dynamic threshold operation using electrically induced junction MOSFET in the deep sub-micrometer CMOS regime
Rao, V. Ramgopal
2004
Understanding the Impact of Process Variations on Analog Circuit Performance with Halo Channel Doped Deep Sub-Micron CMOS Technologies
Rao, V. Ramgopal
2004-12
Anhydrous silanization and antibody immobilization on hotwire CVD deposited silicon oxynitride films
Rao, V. Ramgopal
2005
A new drain voltage enhanced NBTI degradation mechanism [pMOSFETs]
Rao, V. Ramgopal
2004
Effectiveness of Optimum Body Bias for Leakage Reduction in High-K CMOS Circuits
Rao, V. Ramgopal
2004-07
Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS Memories
Rao, V. Ramgopal
2004-07
Understanding the NBTI Degradation in Halo- Doped Channel p-MOSFETs
Rao, V. Ramgopal
2003-04
Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologies
Rao, V. Ramgopal
2011-02
Polarity Dependence of Degradation in Ultra Thin Oxide and JVD Nitride Gate Dielectrics
Rao, V. Ramgopal
Discover
Subject
50
MOSFETs
18
Microcantilevers
16
Organic field effect transistors ...
14
Sensors
13
Degradation
12
CMOS technologies
11
FinFET
10
CMOS technology
10
MOSFET circuits
10
Self-assembled monolayer (SAM)
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2020 - 2023
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