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Issue Date
Title
Author(s)
1999-07
The impact of high-/spl kappa/ gate dielectrics and metal gate electrodes on sub-100 nm MOSFETs
Rao, V. Ramgopal
2006-08
The Effects of Varying Tilt Angle of Halo Implant on the Performance of Sub 100nm LAC MOSFETs
Rao, V. Ramgopal
2003
Thin film single halo (SH) SOI nMOSFETs - hot carrier reliability for mixed mode applications
Rao, V. Ramgopal
2011
Effective dielectric thickness Scaling for High-K Gate Dielectric MOSFETs
Rao, V. Ramgopal
2003-01
Detailed analysis of FIBL in MOS transistors with high-k gate dielectrics
Rao, V. Ramgopal
2003-01
Application of look-up table approach to high-K gate dielectric MOS transistor circuits
Rao, V. Ramgopal
2001
Suppression of Parasitic BJT Action in Single Pocket Thin Film Deep Sub-Micron SOI MOSFETs
Rao, V. Ramgopal
2001
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2001
Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering
Rao, V. Ramgopal
2000-09
Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime
Rao, V. Ramgopal
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Subject
50
EEE
7
Hot carriers
7
Los Angeles Council
5
Degradation
4
Charge pumping
3
Capacitance
3
Circuit simulation
3
Current measurement
3
FinFETs
3
High-K gate dielectrics
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Date issued
2
2010 - 2011
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2000 - 2009
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1997 - 1999