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Issue Date
Title
Author(s)
2001-07
Analysis of floating body effects in thin film SOI MOSFETs using the GIDL current technique
Rao, V. Ramgopal
2002-06
Optimization and realization of sub-100-nm channel length single halo p-MOSFETs
Rao, V. Ramgopal
1999-05
A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs
Rao, V. Ramgopal
1999-09
A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping
Rao, V. Ramgopal
1998-11
Application of charge pumping technique for sub-micron MOSFET characterization
Rao, V. Ramgopal
1998-05
Electric field tailoring in MBE-grown vertical sub-100 nm MOSFETs
Rao, V. Ramgopal
2009
Benchmarking the device performance at sub 22 nm node technologies using an SoC framework
Rao, V. Ramgopal
2008
Sub-20 nm gate length FinFET design: Can high-κ spacers make a difference?
Rao, V. Ramgopal
2008-06
Closed Form Current and Conductance Model for Symmetric Double-Gate MOSFETs using Field-dependent Mobility and Body Doping
Rao, V. Ramgopal
2007
A Simple and Direct Method for Interface Characterization of OFETs
Rao, V. Ramgopal
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EEE
7
Hot carriers
7
Los Angeles Council
5
Degradation
4
Charge pumping
3
Capacitance
3
Circuit simulation
3
Current measurement
3
FinFETs
3
High-K gate dielectrics
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Date issued
2
2010 - 2011
37
2000 - 2009
11
1997 - 1999