Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Help
Sign on to:
My DSpace
Receive email
updates
Edit Profile
BITS Pilani Institutional Repository
Search
Search:
All of DSpace
BITS Audio/Video Collection
BITS Faculty Publications
BITS Library Events
BITS Photos & Memories
BITS Pilani, Dubai Campus
BITS Pilani Gallery
BITS Pilani, Goa Campus
BITS Pilani, Hyderabad Campus
BITS Publications
BITS Rare / Digitized Books
BITS Theses
Daily News
Placement & Career Development Service
Reference Tools & Materials
for
Current filters:
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Start a new search
Add filters:
Use filters to refine the search results.
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Results 41-50 of 50 (Search time: 0.003 seconds).
previous
1
...
2
3
4
5
next
Item hits:
Issue Date
Title
Author(s)
2009
The Electrochemical Society, find out more Analysis of Threshold Voltage Variations of FinFETs Relating to Short Channel Effects
Rao, V. Ramgopal
2004
The influence of process variations on the Halo MOSFETs and its implications on the analog circuit performance
Rao, V. Ramgopal
2004
Understanding the Impact of Process Variations on Analog Circuit Performance with Halo Channel Doped Deep Sub-Micron CMOS Technologies
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
2002-04
Simulation Study of Non-Quasi Static Behaviour of MOS Transistors
Rao, V. Ramgopal
1998-10
Sub-0.18 /spl mu/m SOI MOSFETs using lateral asymmetric channel profile and Ge pre-amorphization salicide technology
Rao, V. Ramgopal
1999
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric
Rao, V. Ramgopal
1999-09
Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics
Rao, V. Ramgopal
1999
Channel engineering for high speed sub-1.0 V power supply deep sub-micron CMOS
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
Discover
Subject
50
EEE
7
Hot carriers
7
Los Angeles Council
5
Degradation
4
Charge pumping
3
Capacitance
3
Circuit simulation
3
Current measurement
3
FinFETs
3
High-K gate dielectrics
.
next >
Date issued
2
2010 - 2011
37
2000 - 2009
11
1997 - 1999