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Results 351-360 of 370 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
2004-07
Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS Memories
Rao, V. Ramgopal
2004-07
Understanding the NBTI Degradation in Halo- Doped Channel p-MOSFETs
Rao, V. Ramgopal
2003-04
Nitrogen dilution effects on structural and electrical properties of hot-wire-deposited a-SiN:H films for deep-sub-micron CMOS technologies
Rao, V. Ramgopal
2011-02
Polarity Dependence of Degradation in Ultra Thin Oxide and JVD Nitride Gate Dielectrics
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
2002-04
Simulation Study of Non-Quasi Static Behaviour of MOS Transistors
Rao, V. Ramgopal
2001-10
Characterization of lateral asymmetric channel (LAC) thin film SOI MOSFETs
Rao, V. Ramgopal
2002-09
Optimization of Single Halo p-MOSFET Implant Parameters for Improved Analog Performance and Reliability
Rao, V. Ramgopal
2011-02
Device Scaling Effects on Substrate Enhanced Degradation in MOS Transistors
Rao, V. Ramgopal
2011-02
Degradation Study of Ultra-Thin JVD Silicon Nitride MNSFET
Rao, V. Ramgopal
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Subject
366
EEE
50
MOSFETs
18
Microcantilevers
16
Organic field effect transistors ...
15
Sensors
13
Degradation
12
CMOS technologies
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FinFET
10
CMOS technology
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