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Issue Date
Title
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2001
Performance optimization of 60 nm channel length vertical MOSFETs using channel engineering
Rao, V. Ramgopal
2000-09
Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
2001
Reliability issues of ultra thin silicon nitride (a-SiN:H) by hot wire CVD for deep sub-micron CMOS technologies
Rao, V. Ramgopal
2001-07
Multi-Frequency Transconductance Technique for Interface Characterization of Deep Sub-Micron SOI-MOSFETs
Rao, V. Ramgopal
2001
High Field Stressing Effects in JVD Nitride Capacitors
Rao, V. Ramgopal
2009-09
Polymer microcantilever biochemical sensors with integrated polymer composites for electrical detection
Rao, V. Ramgopal
2009-05
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs
Rao, V. Ramgopal
2009-05
Solution-Processed Bootstrapped Organic Inverters Based on P3HT With a High- k Gate Dielectric Material
Rao, V. Ramgopal
2009-07
A Novel Table-Based Approach for Design of FinFET Circuits
Rao, V. Ramgopal
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MOSFETs
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Degradation
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MOSFET circuits
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Capacitance
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CMOS technology
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FinFETs
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Threshold voltage
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Circuit simulation
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Hot carriers
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Los Angeles Council
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