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2000-04
Device scaling effects on hot-carrier induced interface and oxide-trapped charge distributions in MOSFETs
Rao, V. Ramgopal
2000-01
A Comprehensive study of hot-carrier induced interface and oxide trap distributions in MOSFETs using a novel charge pumping technique
Rao, V. Ramgopal
2000-09
Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
2000
Low temperature Hot-Wire CVD nitrides for deep sub-micron CMOS technologies
Rao, V. Ramgopal
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Rao, V. Ramgopal
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Silicon
1
Stress
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Temperature
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Thickness measurement
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Transconductance
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