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Results 1-9 of 9 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
2003-08
Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing
Rao, V. Ramgopal
2003
Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs
Rao, V. Ramgopal
2001-09
The Impact of High-K Gate Dielectrics on Sub 100 nm CMOS Circuit Performance
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
2005
A new drain voltage enhanced NBTI degradation mechanism [pMOSFETs]
Rao, V. Ramgopal
2004-07
Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS Memories
Rao, V. Ramgopal
2004-07
Understanding the NBTI Degradation in Halo- Doped Channel p-MOSFETs
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
2002-09
Optimization of Single Halo p-MOSFET Implant Parameters for Improved Analog Performance and Reliability
Rao, V. Ramgopal
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Subject
4
Threshold voltage
3
MOSFET circuits
3
MOSFETs
3
Nonvolatile memory
2
Charge measurement
2
Current measurement
2
Interface states
2
Niobium compounds
2
Pulse measurements
2
Stress
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2001
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2002
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2003
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2005