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Issue Date
Title
Author(s)
2003
Effect of programming biases on the reliability of CHE and CHISEL flash EEPROMs
Rao, V. Ramgopal
2005
A new drain voltage enhanced NBTI degradation mechanism [pMOSFETs]
Rao, V. Ramgopal
2004-07
Sub-threshold Swing Degradation due to Localized Charge Storage in SONOS Memories
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
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Author
4
Rao, V. Ramgopal
Subject
2
Charge measurement
2
Nonvolatile memory
2
Pulse measurements
1
Capacitance
1
Channel hot electron injection
1
Energy Consumption
1
EPROM
1
Integrated circuit reliability
1
Leakage current
1
MOSFET circuits
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