Skip navigation
Home
Browse
Communities
& Collections
Browse Items by:
Issue Date
Author
Title
Subject
Help
Sign on to:
My DSpace
Receive email
updates
Edit Profile
BITS Pilani Institutional Repository
Search
Search:
All of DSpace
BITS Audio/Video Collection
BITS Faculty Publications
BITS Library Events
BITS Photos & Memories
BITS Pilani, Dubai Campus
BITS Pilani Gallery
BITS Pilani, Goa Campus
BITS Pilani, Hyderabad Campus
BITS Publications
BITS Rare / Digitized Books
BITS Theses
Daily News
Placement & Career Development Service
Reference Tools & Materials
for
Current filters:
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Start a new search
Add filters:
Use filters to refine the search results.
Title
Author
Subject
Date Issued
Has File(s)
???jsp.search.filter.original_bundle_filenames???
???jsp.search.filter.original_bundle_descriptions???
Equals
Contains
ID
Not Equals
Not Contains
Not ID
Results 361-366 of 366 (Search time: 0.003 seconds).
previous
1
...
34
35
36
37
next
Item hits:
Issue Date
Title
Author(s)
1999-09
Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics
Rao, V. Ramgopal
1999
Channel engineering for high speed sub-1.0 V power supply deep sub-micron CMOS
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
1998
Plasma process induced abnormal 1/f noise behavior in deep sub-micron MOSFETs
Rao, V. Ramgopal
2000
Low temperature Hot-Wire CVD nitrides for deep sub-micron CMOS technologies
Rao, V. Ramgopal
1998-09
A Study of the Effect of Plasma Etch Damage on Sub-Micron MOSFET's Flicker Noise Properties
Rao, V. Ramgopal
Discover
Subject
50
MOSFETs
18
Microcantilevers
16
Organic field effect transistors ...
14
Sensors
13
Degradation
12
CMOS technologies
11
FinFET
10
CMOS technology
10
MOSFET circuits
10
Self-assembled monolayer (SAM)
.
next >
Date issued
32
2020 - 2023
181
2010 - 2019
128
2000 - 2009
25
1992 - 1999