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Results 1-6 of 6 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
2001
Comparison of Sub-Bandgap Impact Ionization in Sub-100 nm Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2015-06
On the breakdown physics of trench-gate drain extended NMOS
Rao, V. Ramgopal
2001
Comparison of Sub-Bandgap Impact Ionization in Deep-Sub-Micron Conventional and Lateral Asymmetrical Channel nMOSFETs
Rao, V. Ramgopal
2009-05
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs
Rao, V. Ramgopal
1996-06
Hysteresis behavior in 85-nm channel length vertical n-MOSFETs grown by MBE
Rao, V. Ramgopal
2009-12
Filament study of STI type drain extended NMOS device using transient interferometric mapping
Rao, V. Ramgopal
Discover
Subject
2
Electric breakdown
1
CMOS technology
1
Current density
1
Current distribution
1
Electrons
1
Fingers
1
Germanium (Ge)
1
Hot carrier (HC)
1
Hot carriers
1
Hysteresis
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Date issued
1
2010 - 2015
4
2000 - 2009
1
1996 - 1999
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false