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Results 1-6 of 6 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
2003-08
Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing
Rao, V. Ramgopal
2016
Novel hydroxy-phenyl phosphorus porphyrin self-assembled monolayers for conformal n-type doping in Finfets
Rao, V. Ramgopal
2007
A Simple and Direct Method for Interface Characterization of OFETs
Rao, V. Ramgopal
2008
Metallated Porphyrin Self Assembled Monolayers as Cu Diffusion Barriers for the Nano-Scale CMOS Technologies
Rao, V. Ramgopal
2004-12
Anhydrous silanization and antibody immobilization on hotwire CVD deposited silicon oxynitride films
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
Discover
Subject
3
MOSFETs
2
Thickness measurement
1
Charge measurement
1
Charge pumps
1
Copper
1
Degradation
1
Dielectric measurements
1
Dielectrics
1
Doping
1
Electrical resistance measurement
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Date issued
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2010 - 2016
5
2000 - 2009
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false