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Issue Date
Title
Author(s)
2000-09
Drain Bias Dependence of Gate Oxide Reliability in Conventional and Asymmetrical Channel MOSFETs in the Low Voltage Regime
Rao, V. Ramgopal
1997-03
High-field stressing of LPCVD gate oxides
Rao, V. Ramgopal
2009
Automated design and optimization of circuits in emerging technologies
Rao, V. Ramgopal
2005-07
A meso-pyridyl porphyrin self-assembled monolayer on gold substrates for molecular electronics applications
Rao, V. Ramgopal
2005
A new drain voltage enhanced NBTI degradation mechanism [pMOSFETs]
Rao, V. Ramgopal
Discover
Subject
2
Degradation
1
Annealing
1
Atomic force microscopy (AFM)
1
Capacitors
1
Charge measurement
1
Design methodology
1
Design optimization
1
Dielectric substrates
1
Electric variables
1
Electrodes
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Date issued
4
2000 - 2009
1
1997 - 1999
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5
false