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Results 31-39 of 39 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
2008
Sub-20 nm gate length FinFET design: Can high-κ spacers make a difference?
Rao, V. Ramgopal
2008-06
Closed Form Current and Conductance Model for Symmetric Double-Gate MOSFETs using Field-dependent Mobility and Body Doping
Rao, V. Ramgopal
2007
A Simple and Direct Method for Interface Characterization of OFETs
Rao, V. Ramgopal
2009
The Electrochemical Society, find out more Analysis of Threshold Voltage Variations of FinFETs Relating to Short Channel Effects
Rao, V. Ramgopal
2004
The influence of process variations on the Halo MOSFETs and its implications on the analog circuit performance
Rao, V. Ramgopal
2004
Understanding the Impact of Process Variations on Analog Circuit Performance with Halo Channel Doped Deep Sub-Micron CMOS Technologies
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
2002-04
Simulation Study of Non-Quasi Static Behaviour of MOS Transistors
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
Discover
Subject
5
Hot carriers
5
Los Angeles Council
3
Charge pumping
3
Circuit simulation
3
Current measurement
3
Degradation
3
FinFETs
3
Medical simulation
3
Semiconductor device doping
3
Silicon
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Date issued
2
2010 - 2011
37
2000 - 2009