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Issue Date
Title
Author(s)
2003-08
Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing
Rao, V. Ramgopal
2007
A Simple and Direct Method for Interface Characterization of OFETs
Rao, V. Ramgopal
2000
Reliability studies on sub 100 nm SOI-MNSFETs
Rao, V. Ramgopal
Discover
Author
3
Rao, V. Ramgopal
Subject
1
Charge measurement
1
Charge pumps
1
Degradation
1
Dielectric measurements
1
Dielectrics
1
Gate leakage
1
Hot carriers
1
Interface states
1
Organic field effect transistors ...
1
Pentacene
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Date issued
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