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Results 41-50 of 62 (Search time: 0.003 seconds).
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Issue Date
Title
Author(s)
1997-12
Simulation, fabrication and characterization of high performance planar-doped-barrier sub 100 nm channel MOSFETs
Rao, V. Ramgopal
1992-01
Radiation Induced Interface State Generation in Nitrided and Reoxidized Nitrided Gate Oxides
Rao, V. Ramgopal
1997-10
The Planar-Doped-Barrier FET:MOSFET Overcomes Conventional Limitations
Rao, V. Ramgopal
1998-05
Charge injection using gate-induced-drain-leakage current for characterization of plasma edge damage in CMOS devices
Rao, V. Ramgopal
1998-12
Flicker Noise in GaN/Al Ga N Doped Channel Heterostructure Field Effect Transistors
Rao, V. Ramgopal
1997-03
Charge trapping behaviour in deposited and grown thin metal-oxide-semiconductor gate dielectrics
Rao, V. Ramgopal
1999-05
A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs
Rao, V. Ramgopal
1999-09
Low temperature-high pressure grown thin gate dielectrics for MOS applications
Rao, V. Ramgopal
1997-03
High-field stressing of LPCVD gate oxides
Rao, V. Ramgopal
1999-09
A study of 100 nm channel length asymmetric channel MOSFET by using charge pumping
Rao, V. Ramgopal
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Author
25
Rao, V. Ramgopal
4
Chaubey, V.K.
1
Atkinson, A.D.S
1
Bhanot, Surekha
1
Bhim Chandra., Chatterjee
1
Bohle, Hermann
1
Butler, J.A.V
1
Colvin, H. F
1
Curtis, Harvey L.
1
Dake, H.C
.
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Subject
11
MOSFETs
4
Degradation
2
Annealing
2
Electron traps
2
Etching
2
Hot carriers
2
Los Angeles Council
2
Metal-oxide-semiconductor (MOS)
2
MOS devices
2
Noise figure
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Date issued
29
1990 - 1999
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1980 - 1989
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1950 - 1959
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1940 - 1949
4
1930 - 1939
5
1920 - 1929
1
1916 - 1919
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32
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