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Issue Date
Title
Author(s)
2003-08
Reliability of ultrathin JVD silicon nitride MNSFETs under high field stressing
Rao, V. Ramgopal
2001-09
Study of Degradation in Channel Initiated Secondary Electron Injection Regime
Rao, V. Ramgopal
2002-07
Physical mechanisms for pulsed AC stress degradation in thin gate oxide MOSFETs
Rao, V. Ramgopal
1999
100 nm channel length MNSFETs using a jet vapor deposited ultra-thin silicon nitride gate dielectric
Rao, V. Ramgopal
1999-09
Capacitance Degradation due to Fringing Field in Deep Sub-Micron MOSFETs with High-K Gate Dielectrics
Rao, V. Ramgopal
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Author
5
Rao, V. Ramgopal
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Hot carriers
1
Capacitance
1
Charge measurement
1
Charge pumping
1
Charge pumps
1
Current measurement
1
Dielectrics
1
Dielectrics and electrical insula...
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Gate leakage
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High-K gate dielectrics
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