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Browsing by Subject "Jet Vapour Deposited (JVD)"

Browsing by Subject "Jet Vapour Deposited (JVD)"

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  • Degradation Study of Ultra-Thin JVD Silicon Nitride MNSFET 
    Rao, V. Ramgopal (Springer, 2011-02)
    In this paper we discuss a new method for measuring border trap density (Nbt) in sub-micron transistors using the hysteresis in drain current. We have used this method to measure Nbt in jet Vapour Deposited (JVD) Silcon ...