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Effect of Longitudinal Electric Field and Self Heating of Channel on Linearity and Gain of AlGaN/GaN HEMT on Sapphire (0001)

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dc.contributor.author Kumar, Rahul
dc.date.accessioned 2023-04-03T10:44:05Z
dc.date.available 2023-04-03T10:44:05Z
dc.date.issued 2014
dc.identifier.uri https://ieeexplore.ieee.org/abstract/document/6808083
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/10155
dc.description.abstract Change of linearity and gain with different drain and gate bias has been studied for AlGaN/GaN HEMT on Sapphire substrate. While linearity increases with higher drain bias, maximum gain of the device decreases. Generation of more phonon and its related scattering of electrons decrease the mobility of carries. It further minimizes the drain current at high longitudinal field on 2DEG channel. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.subject EEE en_US
dc.subject High-electron-mobility transistor (HEMT) en_US
dc.subject AlGaN/GaN Sapphire en_US
dc.subject Linearity en_US
dc.subject Gain en_US
dc.title Effect of Longitudinal Electric Field and Self Heating of Channel on Linearity and Gain of AlGaN/GaN HEMT on Sapphire (0001) en_US
dc.type Article en_US


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