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Improved hetero-junction TFET-based Schmitt trigger designs for ultra-low-voltage VLSI applications

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dc.contributor.author Vidhyadharan, Sanjay
dc.date.accessioned 2023-04-06T09:25:05Z
dc.date.available 2023-04-06T09:25:05Z
dc.date.issued 2021-03
dc.identifier.uri https://www.emerald.com/insight/content/doi/10.1108/WJE-08-2020-0367/full/html
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/10213
dc.description.abstract Tunnel field effect transistors (TFETs) have significantly steeper sub-threshold slope (24–30 mv/decade), as compared with the conventional metal–oxide–semiconductor field-effect transistors (MOSFETs), which have a sub-threshold slope of 60 mv/decade at room temperature. The steep sub-threshold slope of TFETs enables a much faster switching, making TFETs a better option than MOSFETs for low-voltage VLSI applications. The purpose of this paper is to present a novel hetero-junction TFET-based Schmitt triggers, which outperform the conventional complementary metal oxide semiconductor (CMOS) Schmitt triggers at low power supply voltage levels. en_US
dc.language.iso en en_US
dc.publisher Emerald en_US
dc.subject EEE en_US
dc.subject VLSI applications en_US
dc.subject TFET-based Schmitt en_US
dc.title Improved hetero-junction TFET-based Schmitt trigger designs for ultra-low-voltage VLSI applications en_US
dc.type Article en_US


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