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Thermo-physical characteristics of 3C‐SiC structure subjected to microwave exposure: A molecular dynamics study

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dc.contributor.author Mishra, Radha Raman
dc.contributor.author Belgamwar, Sachin U.
dc.contributor.author Roy, Tribeni
dc.date.accessioned 2023-10-09T11:07:25Z
dc.date.available 2023-10-09T11:07:25Z
dc.date.issued 2023-06
dc.identifier.uri https://www.sciencedirect.com/science/article/pii/S2352492823003847
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12295
dc.description.abstract Silicon carbide (SiC) is widely used as a susceptor for microwave hybrid heating applications owing to its exceptional microwave absorbing characteristics. In practice, it is challenging to characterize the thermo-physical behaviour of the microwave irradiated SiC-based targets experimentally due to interference of integrated measurement devices with microwaves. In this article, molecular dynamics simulations were performed to understand the atomistic response of a bulk 3C‐SiC model during microwave heating. Atomistic simulations were performed at different electric field strengths (ranging from 0.1 to 0.5 V/Å) and frequencies (ranging from 100 to 500 GHz) to develop a numerical relationship between temperature and time in order to predict the thermal response of bulk 3C‐SiC. On the other hand, the physical characteristics of the bulk 3C‐SiC were determined by the plots between mean square displacement (MSD), time and diffusion coefficients. The results showed that at 0.5 V/Å electric field strength and 500 GHz frequency, the diffusion coefficient increased up to 88% as compared to the electric field strength of 0.1 V/Å at 500 GHz. A change of 75% in the physical phase of 3C‐SiC structure with respect to the initial structure was confirmed by the distorted density distribution profile. en_US
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.subject Mechanical Engineering en_US
dc.subject Microwave heating en_US
dc.subject Molecular dynamics en_US
dc.subject 3C-SiC en_US
dc.subject Electric field strength en_US
dc.subject Frequency en_US
dc.subject Atomistic simulation en_US
dc.title Thermo-physical characteristics of 3C‐SiC structure subjected to microwave exposure: A molecular dynamics study en_US
dc.type Article en_US


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