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Sensitivity Improvement of Medical Dosimeters Using Solution Processed TIPS-Pentacene FETs

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dc.contributor.author Rao, V. Ramgopal
dc.date.accessioned 2023-10-21T05:50:49Z
dc.date.available 2023-10-21T05:50:49Z
dc.date.issued 2019-06
dc.identifier.uri https://ieeexplore.ieee.org/document/8653375
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12571
dc.description.abstract In this paper, we have explored the electrical and material properties of TIPS-Pentacene for low doses of gamma irradiation. Interface trap/defect generation was studied post gamma irradiation of TIPS-Pentacene transistors. This paper demonstrates that the traps/defects at the bulk/surface of TIPS-Pentacene and SiO2/Si interface states significantly influence the sensing behavior. It is demonstrated that the interface trap charges introduced by the gamma radiation are significant in the TIPS-Pentacene thin-film instead of the SiO2/Si. The detector exhibits a record high sensitivity of ~3 V/Gy at 1 Gy in ambient air. A theoretical model was developed to understand the change in ON-current and channel doping. The change in surface potential of film was studied by Kelvin probe force microscopy (KPFM). Developed model was in good agreement with the KPFM results. These promising results indicate that our device can be used as a dosimeter for medical applications with high sensitivity. en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.subject EEE en_US
dc.subject Gamma radiation detection en_US
dc.subject Organic field effect transistors (OFETs) en_US
dc.subject TIPS-Pentacene en_US
dc.subject KPFM en_US
dc.subject XPS en_US
dc.title Sensitivity Improvement of Medical Dosimeters Using Solution Processed TIPS-Pentacene FETs en_US
dc.type Article en_US


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