dc.contributor.author | Rao, V. Ramgopal | |
dc.date.accessioned | 2023-10-23T04:08:41Z | |
dc.date.available | 2023-10-23T04:08:41Z | |
dc.date.issued | 2017-05 | |
dc.identifier.uri | https://ieeexplore.ieee.org/document/7885519 | |
dc.identifier.uri | http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12587 | |
dc.description.abstract | In this letter, we show that using the experimentally demonstrated nano-electro-mechanical-switches (NEMS) and our design methodology, the standby power dissipation can be reduced to negligible levels in 14-nm bulk FinFET technologies. Using two realistic NEMS structures, demonstrated in the literature for power gating applications, a design window is derived for achieving the targeted specifications without compromising on the performance and area. Cantilever NEMS requires less area as compared with the suspended NEMS, but reliability is a concern. We demonstrate that for a 17-stage ring oscillator circuit, the NEMS power gating will perform better than the FinFET-based power gating when the T ON /T OFF ratio is less than 0.002. | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEEE | en_US |
dc.subject | EEE | en_US |
dc.subject | NEMS | en_US |
dc.subject | Power gating (PG) | en_US |
dc.subject | FinFET | en_US |
dc.subject | Berkeley short-channel IGFET model–common multi-gate (BSIM-CMG) | en_US |
dc.title | A Nano-Electro-Mechanical Switch Based Power Gating for Effective Stand-by Power Reduction in FinFET Technologies | en_US |
dc.type | Article | en_US |
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