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Strain induced anisotropic effect on electron mobility in C60 based organic field effect transistors

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dc.contributor.author Rao, V. Ramgopal
dc.date.accessioned 2023-10-26T10:01:29Z
dc.date.available 2023-10-26T10:01:29Z
dc.date.issued 2022-08
dc.identifier.uri https://pubs.aip.org/aip/apl/article/101/8/083305/111989/Strain-induced-anisotropic-effect-on-electron
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12645
dc.description.abstract The electron mobility was found to increase (decrease) upon applied compressive (tensile) strain, respectively, when a high-performance flexible C60-based organic field-effect transistor (OFET) was subjected to different bending radii. The observed almost twofold relative change in the electron mobility is considerably larger than that reported before for pentacene-based OFETs. Moreover, the strain dependency of electron mobility in C60 films is strongly anisotropic with respect to the strain direction measured relative to the current flow. Analysis within a hopping-transport model for OFET mobility suggests that the observed strain dependency on electron transport is dominated mostly by the change of inter-grain coupling in polycrystalline C60 films. en_US
dc.language.iso en en_US
dc.publisher AIP en_US
dc.subject EEE en_US
dc.subject Electron mobility en_US
dc.subject Anisotropic Motion en_US
dc.title Strain induced anisotropic effect on electron mobility in C60 based organic field effect transistors en_US
dc.type Article en_US


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