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Chemical Vapor Deposition Precursors for High Dielectric Oxides: Zirconium and Hafnium Oxide

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dc.contributor.author Rao, V. Ramgopal
dc.date.accessioned 2023-10-28T04:32:30Z
dc.date.available 2023-10-28T04:32:30Z
dc.date.issued 2009
dc.identifier.uri https://www.tandfonline.com/doi/abs/10.1080/15533170903094964
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12696
dc.description.abstract High dielectric oxides namely ZrO2 and HfO2 have gained a lot of importance as they are candidates in the electronic industry in the form of CMOS technology. A complete review of the literature examples of the precursors employed in the deposition of the thin films of these metal oxides, followed by methodology to design precursors with desirable physicochemical properties have been described in this review article. en_US
dc.language.iso en en_US
dc.publisher Taylor & Francis en_US
dc.subject EEE en_US
dc.subject CVD precursors en_US
dc.subject Hafnia en_US
dc.subject High dialectric oxides en_US
dc.subject Oxide precursors en_US
dc.subject Zirconia en_US
dc.title Chemical Vapor Deposition Precursors for High Dielectric Oxides: Zirconium and Hafnium Oxide en_US
dc.type Article en_US


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