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A CAD-compatible closed form approximation for the inversion charge areal density in double-gate MOSFETs

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dc.contributor.author Rao, V. Ramgopal
dc.date.accessioned 2023-10-28T06:47:23Z
dc.date.available 2023-10-28T06:47:23Z
dc.date.issued 2009-02
dc.identifier.uri https://www.sciencedirect.com/science/article/abs/pii/S003811010800378X
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12703
dc.description.abstract In developing the drain current model of a symmetrically driven, undoped (or lightly doped) symmetric double-gate MOSFET (SDGFET), one encounters a transcendental equation relating the value of an intermediate variable β (which is related to the inversion charge areal density and also surface-potential) to the gate and drain voltages; as a result, it doesn’t have a closed form solution. From a compact modeling perspective, it is desirable to have closed form expressions in order to implement them in a circuit simulator. In this paper, we present an accurate closed form approximation for the inversion charge areal density, based on the Lambert-W function. We benchmark our approximation against other existing approximations and show that our approximation is computationally the most efficient and numerically the most robust, at a reduced but acceptable accuracy. Hence, it is suitable for use in implementing inversion charge based compact models. en_US
dc.language.iso en en_US
dc.publisher Elsevier en_US
dc.subject EEE en_US
dc.subject MOSFETs en_US
dc.title A CAD-compatible closed form approximation for the inversion charge areal density in double-gate MOSFETs en_US
dc.type Article en_US


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