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Fabrication and Characterization of a Polymeric Microcantilever With an Encapsulated Hotwire CVD Polysilicon Piezoresistor

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dc.contributor.author Rao, V. Ramgopal
dc.date.accessioned 2023-10-28T06:56:52Z
dc.date.available 2023-10-28T06:56:52Z
dc.date.issued 2009-02
dc.identifier.uri https://ieeexplore.ieee.org/document/4711134
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12705
dc.description.abstract We demonstrate a novel photoplastic nanoelectromechanical device that includes an encapsulated polysilicon piezoresistor. The temperature limitation that typically prevents deposition of polysilicon films on polymers was overcome by employing a hotwire CVD process. In this paper, we report the use of this process to fabricate and characterize a novel polymeric cantilever with an embedded piezoresistor. This device exploits the low Young's modulus of organic polymers and the high gauge factor of polysilicon. The fabricated device fits into the cantilever holder of an atomic force microscope (AFM) and can be used in conjunction with the AFM's liquid cell for detecting the adsorption of biochemicals. It enables differential measurement while preventing biochemicals from interfering with measurements using the piezoresistor. The mechanical and electromechanical characterization of the device is also reported in this paper en_US
dc.language.iso en en_US
dc.publisher IEEE en_US
dc.subject EEE en_US
dc.subject Affinity cantilevers en_US
dc.subject Bio-microelectromechanical system (bio-MEMS) en_US
dc.subject Hotwire CVD (HWCVD) en_US
dc.subject Piezoresistive sensing en_US
dc.subject Polymeric cantilevers en_US
dc.title Fabrication and Characterization of a Polymeric Microcantilever With an Encapsulated Hotwire CVD Polysilicon Piezoresistor en_US
dc.type Article en_US


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