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Investigations of enhanced device characteristics in pentacene-based field effect transistors with sol-gel interfacial layer

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dc.contributor.author Rao, V. Ramgopal
dc.date.accessioned 2023-10-30T08:51:24Z
dc.date.available 2023-10-30T08:51:24Z
dc.date.issued 2007-03
dc.identifier.uri https://pubs.aip.org/aip/apl/article/90/12/122112/332712/Investigations-of-enhanced-device-characteristics
dc.identifier.uri http://dspace.bits-pilani.ac.in:8080/xmlui/handle/123456789/12721
dc.description.abstract Pentacene films grown on sol-gel silica dielectrics showed a significant enhancement in field effect mobility, threshold voltages, and subthreshold swings. This letter investigates the contributing factors for the enhanced device characteristics. The smoother and more hydrophobic film surfaces of sol-gel silica (rms roughness of ∼1.9Å and water contact angle of ∼75°⁠) induced larger pentacene grains, yielding mobilities in excess of ∼1cm2/Vs at an operating voltage of −20V⁠. Different sol-gel silica film thicknesses showed similar trends in improved performances, indicating that this phenomenon is clearly a semiconductor-dielectric interface phenomenon rather than a bulk dielectric effect. en_US
dc.language.iso en en_US
dc.publisher AIP en_US
dc.subject EEE en_US
dc.subject Organic field effect transistors (OFETs) en_US
dc.subject Transistors en_US
dc.title Investigations of enhanced device characteristics in pentacene-based field effect transistors with sol-gel interfacial layer en_US
dc.type Article en_US


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